AFM探针描述
适用的Sample:
Data Storage,Other Hard Samples,Semiconductors
适用的AFM机型:
Insight
适用的Work Mode:
Critical Dimension (CD) AFM
适用的Application:
Holes/ Trenches
Coating 描述
| cantilever Back side coating | Reflective Aluminum |
|---|---|
| tip coating | -- |
Tip 规格
| tip geometry | Critical Dimension (Overhang) |
|---|---|
| tip radius (Nom) | -- |
| tip height | 10-20um |
| overhang | 3-5nm |
| Effective Length | 180-220nm |
| Tip Width | 27-32nm |
Cantilever 规格
| cantilever geometry | Rectangular |
|---|---|
| K(Nom) | 35N/m |
| Frequency(Nom) | 292KHz |
| length(Nom) | 125um |
| thickness(Nom) | 3.3um |
| cantilever material | 0.010 - 0.025 Ωcm Silicon |
| top layer back | -- |
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Frequency
Nom:
70KHz
Spring Const.
Nom:
2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
