DDLTESP-V2
  • Manufacturer: Bruker
  • Cantilever Coating: B: Reflective Aluminum,F: Conductive Diamond
  • Tip Geometry: Standard
  • Number of Cantilevers: 1个悬臂
    F280KHz K95N/m L225um
AFM探针描述

适用的Sample:

适用的AFM机型:
DimensionIcon

适用的Work Mode:
CAFM,contact resonance,PeakForce TUNA,PFM,SCM,SSRM

适用的Application:
Electrical,Mechanical Force Curves,Mechanical Property Mapping

Coating 描述
cantilever Front side coating Conductive Diamond
cantilever Back side coating Reflective Aluminum
tip coating Conductive Diamond
Tip 规格
tip geometry Standard
tip radius (Nom) 100nm
tip height 10-15um
Front Angle (FA) 25±2°
Back Angle (BA) 15±2°
Side Angle (SA) 17.5±2°
Cantilever 规格
cantilever geometry Rectangular
K(Nom) 95N/m
Frequency(Nom) 280KHz
length(Nom) 225um
thickness(Nom) 7um
cantilever material Silicon
top layer back --
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Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
探针对比
探针型号对比
开始对比 最多4个
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