AFM探针描述
适用的Sample:
Ceramics,Data Storage,Other Hard Samples,Other Soft Sample,Polymers,Semiconductors
适用的AFM机型:
DimensionIcon,DimensionXR,JPK,MultiMode
适用的Work Mode:
PeakForce TUNA
适用的Application:
Electrical
Coating 描述
| cantilever Front side coating | Conductive PtIr |
|---|---|
| cantilever Back side coating | Reflective PtIr |
| tip coating | Platinum/ Iridium |
Tip 规格
| tip geometry | Rotated (Symmetric) |
|---|---|
| tip radius (Nom) | 25nm |
| tip height | 2.5-8.0um |
| Front Angle (FA) | 15±2.5° |
| Back Angle (BA) | 25±2.5° |
| Side Angle (SA) | 17.5±2.5° |
Cantilever 规格
| cantilever geometry | Triangular |
|---|---|
| K(Nom) | 0.4N/m |
| Frequency(Nom) | 70KHz |
| length(Nom) | 115um |
| thickness(Nom) | 0.65um |
| cantilever material | Silicon Nitride |
| top layer back | -- |
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Frequency
Nom:
70KHz
Spring Const.
Nom:
2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
