SMIM-300
  • Manufacturer: Bruker
  • Cantilever Coating: B: TiW/Au (500)
  • Tip Geometry: Pyramid
  • Number of Cantilevers: 1个悬臂
    F19KHz K1.0N/m L300um
AFM探针描述

适用的Sample:
Other Hard Samples,Polymers,Semiconductors

适用的AFM机型:
DimensionIcon,DimensionXR

适用的Work Mode:
CAFM,peakforce tapping,SCM,sMIM

适用的Application:
Electrical

Coating 描述
cantilever Back side coating TiW/Au (500)
tip coating TiW
Tip 规格
tip geometry Pyramid
tip radius (Nom) 50 ± 10nm
tip height 4.5-5.5um
Front Angle (FA) 35±1°
Back Angle (BA) 35±1°
Side Angle (SA) 35±1°
Cantilever 规格
cantilever geometry Rectangular
K(Nom) 1.0N/m
Frequency(Nom) 19KHz
length(Nom) 300um
thickness(Nom) 3.6um
cantilever material Silicon Nitride
top layer back TiW/Au (500)
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Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
探针对比
探针型号对比
开始对比 最多4个
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