TESP-HAR
  • Manufacturer: Bruker
  • Cantilever Coating:
  • Tip Geometry: High Aspect Ratio
  • Number of Cantilevers: 1个悬臂
    F320KHz K42N/m L125um
AFM探针描述

适用的Sample:
Other Hard Samples,Semiconductors

适用的AFM机型:
DimensionIcon,DimensionXR,Innova,Non-Bruker

适用的Work Mode:
tapping or non-contact

适用的Application:
Holes/ Trenches

Coating 描述
tip coating --
Tip 规格
tip geometry High Aspect Ratio
tip radius (Nom) 10nm
tip height 10-15um
Front Angle (FA) 5±1°
Back Angle (BA) 5±1°
Side Angle (SA) 5±1°
Spike Height 4500nm
Spike Width 200nm
Cantilever 规格
cantilever geometry Rectangular
K(Nom) 42N/m
Frequency(Nom) 320KHz
length(Nom) 125um
thickness(Nom) 4um
cantilever material 0.01 - 0.025 Ωcm Antimony (n) doped Si
top layer back --
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Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
探针对比
探针型号对比
开始对比 最多4个
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