VITA-HE-NANOTA-200
  • Manufacturer: Bruker
  • Cantilever Coating:
  • Tip Geometry: Standard (Steep)
  • Number of Cantilevers: 1个悬臂
AFM探针描述

Nano Thermal Analysis probes, 200µm Length

适用的Sample:

适用的AFM机型:
Innova,MultiMode

适用的Work Mode:
NanoScale TA

适用的Application:

Coating 描述
tip coating --
Tip 规格
tip geometry Standard (Steep)
tip radius (Nom) <30nm
tip height 3-6um
Cantilever 规格
cantilever geometry Rectangular
K(Nom)
Frequency(Nom)
length(Nom) 200um
thickness(Nom) --
cantilever material Silicon
top layer back --
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Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
探针对比
探针型号对比
开始对比 最多4个
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